Pattern Matching

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Ogawa [73] has an interesting
application involving pattern recognition. Given a ``target'' picture
and an input picture (which involve only a set of points), a related
compatibility graph is created whose vertices correspond to pairs of points.
There is an edge between two vertices if the corresponding pairs are
``mutually consistent'' (where this can depend on a variety of restrictions,
including angular relationships as well as the requirement that no
point be matched with more than one other). A large clique represents a
large number of mutually consistent pairs, and its size can be used as
a measure of the corresponding fit. This model seems to correctly recognize
affine transformations as well as moderately nonlinear
transformations.

* Michael A. Trick *

Thu Oct 27 21:43:48 EDT 1994